Additional Features:
- Built-in graphics analysis functions including marker and cursor which provides direct numeric readouts and a line function for automatic calculation of line gradient and X-Y axis intercept values.
- For greater versatility and capabilities the Agilent 4145A incorporates a built-in flexible disc drive for permanent storage of user programs and measurement results.
- Four programmable stimulus/measurement units capable of high resolution plus wide range sourcing and sensing (1 pA to 100 mA; 1 mV to 100 V)
The Agilent 4145A semiconductor parameter analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, and ICs.
